Centering (Measured to the Micron)
Corner & Edge Analysis
Surface Condition (Scratch & Dings)
High Mag Print Pattern Analysis
Z-Plane Analysis (Micro Dent, Warping, and Factory Defects)
High Resolution Microscopic Images and Annotations Included With Each Report
HD Video scan of card (Front and Back)
Centering (Measured to the Micron)
Corner & Edge Analysis
Surface Condition (Scratch & Dings)
High Mag Print Pattern Analysis
Z-Plane Analysis (Micro Dent, Warping, and Factory Defects)
High Resolution Microscopic Images and Annotations Included With Each Report
HD Video scan of card (Front and Back)
